Industrial Microscopes

LV Series

Flexible Industrial Microscopy

The modular design of the Eclipse LV series allows an unprecedented level of versatility. The Eclipse LV series offers flexibility that enables it to cover a wide variety of products and applications, extending from development and quality control to inspection in the manufacturing process. Users will recognize the superb performance of the Eclipse LV series when inspecting semiconductors, FPD, packages, electronics substrates, materials (material science), medical devices, cast/metallic/ceramic parts, precision molds, MEMS, telecommunications devices, and a wide variety of other samples.

A wide variety of observation methods are available with the Eclipse LV series. Observation with first-order red compensator, UV polarizing, and epi-fluorescence observation with UV excitation, in addition to brightfield, darkfield, DIC, simple polarizing, epi-fluorescence (excitation using visible light) and double-beam interferometry are all possible. A new motorized illuminator has been added to the existing manual type. A 12V-50W halogen light source—equivalent to or even brighter than the 12V-100W type—and a high-intensity mercury fiber light source are available. The inclusion of a compact and lightweight white LED illuminator exclusively for brightfield use gives you the option of selecting the most appropriate combination for your purpose.

Download brochure: LV100-150.pdf