Industrial Microscopes

L300N / L300ND

High Quality Wafer Inspection

Taking advantage of the 60mm parfocal distance, the new series provides longer working distance while
maintaining higher numerical aperture. The CFI60 offers both image brightness and ease of operation. Furthermore, optical centricity has been improved to minimize image shifts that might occur when changing the objective magnification. To minimize flare, Nikon has applied special coatings to the objectives and formed their surfaces to prevent stray light. Nikon has further reduced the chance of flare by
cutting the number of reflections inside the eyepiece tube, achieving high contrast never before possible. The main control knobs and buttons are located in the front of the base to allow quick, easy operation while viewing samples, and minimize fatigue during lengthy observations.

The ideal ststem for large LCD panels, wafers or components.

 

Download brochure: L300-300D.pdf